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Rajasthan Technical University, Kota, Rajasthan
BTECH E-ALL EE EX EI EC 3 SEM PAPERS
BTECH-EE-EC-EIC-CS-IT-3-SEM-GENERAL-STUDIES-HUL201-2024
BTECH-EE-EX-3-SEM-ADVANCE-MATHEMATICS-3E1216-FEB-2023
BTECH-EE-EX-3-SEM-ANALOG-ELECTRONICS-3E1217-FEB-2023
BTECH-EE-EX-3-SEM-ELECTRICAL-CIRCUIT-ANALYSIS-3E1218-FEB-2023
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINE-1-3E1219-FEB-2023
BTECH-EE-EX-3-SEM-ELECTROMAGNETIC-FIELDS-3E1220-FEB-2023
BTECH-EE-EX-3-SEM-POWER-GENERATION-PROCESS-3E1221-FEB-2023
BTECH-EI-EC-3-SEM-DIGITAL-SYSTEM-DESIGN-3E1222-FEB-2023
BTECH-EI-EC-3-SEM-ELECTRONIC-DEVICES-3E1223-FEB-2023
BTECH-EI-EC-3-SEM-NETWORK-THEORY-3E1224-FEB-2023
BTECH-EI-EC-3-SEM-SIGNAL-AND-SYSTEMS-3E1225-FEB-2023
BTECH-EE-EX-3-SEM-ADVANCE-MATHEMATICS-3E1216-MAY-2022
BTECH-EE-3-SEM-ANALOG-ELECTRONICS-3E040421-DEC-2021
BTECH-EE-3-SEM-DC-MACHINES-AND-TRANSFORMERS-3E040621-DEC-2021
BTECH-EE-3-SEM-ELECTRICAL-POWER-GENERATION-3E040221-DEC-2021
BTECH-EE-3-SEM-ELECTROMAGNETIC-FIELD-THEORY-3E040321-DEC-2021
BTECH-EE-3-SEM-INTEGRAL-TRANSFORMS-AND-COMPLEX-VARIABLES-3E040121-DEC-2021
BTECH-EC-EI-3-SEM-DIGITAL-SYSTEM-DESIGN-3E1147-DEC-2019
BTECH-EC-EI-3-SEM-ELECTRONICS-DEVICES-3E1150-DEC-2019
BTECH-EC-EI-3-SEM-NETWORK-THEORY-3E1149-DEC-2019
BTECH-EC-EI-3-SEM-SIGNAL-AND-SYSTEMS-3E1148-DEC-2019
BTECH-EE-EX-3-SEM-ADVANCE-MATHEMATICS-3E1141-DEC-2019
BTECH-EE-EX-3-SEM-ANALOG-ELECTRONICS-3E1144-DEC-2019
BTECH-EE-EX-3-SEM-ELECTRICAL-CIRCUIT-ANALYSIS-3E1143-DEC-2019
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINES-1-3E1145-DEC-2019
BTECH-EE-EX-3-SEM-ELECTROMAGNETIC-FIELD-3E1146-DEC-2019
BTECH-EC-EI-3-SEM-DIGITAL-SYSTEM-DESIGN-3E1147-DEC-2018
BTECH-EC-EI-3-SEM-ELECTRONICS-DEVICES-3E1150-DEC-2018
BTECH-EC-EI-3-SEM-NETWORK-THEORY-3E1149-DEC-2018
BTECH-EC-EI-3-SEM-SIGNAL-AND-SYSTEMS-3E1148-DEC-2018
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1642-DEC-2018
BTECH-EE-EX-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1646-DEC-2018
BTECH-EE-EX-3-SEM-ANALOG-ELECTRONICS-3E1144-DEC-2018
BTECH-EE-EX-3-SEM-ELECTRICAL-CIRCUIT-ANALYSIS-3E1143-DEC-2018
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINE-1-3E1145-DEC-2018
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINES-1-3E1645-DEC-2018
BTECH-EE-EX-3-SEM-ELECTROMAGNETIC-FIELD-3E1146-DEC-2018
BTECH-EE-EX-3-SEM-POWER-GENERATION-PROCESS-3E1142-DEC-2018
BTECH-EE-EX-CS-IT-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-DEC-2018
BTECH-EX-EE-3-SEM-ADVANCE-MATHEMATICS-3E1141-DEC-2018
BTECH-EC-3-SEM-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E1614-DEC-2017
BTECH-EC-3-SEM-DIGITAL-ELECTRONICS-3E1653-DEC-2017
BTECH-EC-3-SEM-ELECTROMAGNETIC-PROPERTIES-OF-MATERIALS-3E1615-DEC-2017
BTECH-EE-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1646-DEC-2017
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1642-DEC-2017
BTECH-EE-3-SEM-ELECTRICAL-MACHINES-1-3E1645-DEC-2017
BTECH-EE-3-SEM-ELECTRICAL-MEASUREMENTS-3E1485-DEC-2017
BTECH-EE-EX-CS-IT-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-DEC-2017
BTECH-EC-EI-3-SEM-DIGITAL-ELECTRONICS-3E1653-JAN-2016
BTECH-EC-EI-3-SEM-ELECTROMAGNETIC-PROPERTIES-OF-MATERIALS-3E1615-DEC-2016
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1642-DEC-2016
BTECH-EE-3-SEM-ELECTRICAL-MEASUREMENTS-3E1485-DEC-2016
BTECH-EE-3-SEM-ELECTRONIC-DEVICES-AND-CIRCUITS-3EU3041-DEC-2016
BTECH-EE-EC-EI-3-SEM-ELECTRONICS-DEVICES-AND-CIRCUITS-3E1641-JAN-2016
BTECH-EE-EX-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1646-JUN-2016
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINES-1-3E1645-DEC-2016
BTECH-EE-EX-3-SEM-ELECTRICAL-MACHINES-1-3E1645-JAN-2016
BTECH-EE-EX-CS-IT-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-DEC-2016
BTECH-EE-EX-CS-IT-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-JAN-2016
BTECH-EE-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1646-2015
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1642-DEC-2015
BTECH-EE-3-SEM-ELECTRICAL-MACHINES-1-3E1645-2015
BTECH-EE-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-2015
BTECH-EC-3-SEM-ELECTRONIC-DEVICES-AND-CIRCUITS-3E1641-2014
BTECH-EC-BM-3-SEM-ELECTRONICS-MEASUREMENTS-AND-INSTRUMENTATION-3E1494-2014
BTECH-EC-EI-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1616-2014
BTECH-EC-EI-3-SEM-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E1614-2014
BTECH-EC-EI-3-SEM-DATA-STRUCTURES-AND-ALGORITHMS-3E1612-2014
BTECH-EC-EI-3-SEM-ELECTROMAGNETIC-PROPERTIES-OF-MATERIALS-3E1615-2014
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1642-2014
BTECH-EE-3-SEM-ELECTRICAL-MACHINES-1-3E1645-2014
BTECH-EE-3-SEM-ELECTRONICS-DEVICES-AND-CIRCUITS-3E1641-2014
BTECH-EE-EX-3-SEM-ADVANCED-ENGINEERING-MATHEMATICS-1-3E1646-2014
BTECH-EE-EX-CS-IT-3-SEM-OBJECT-ORIENTED-PROGRAMMING-3E1654-2014
BTECH-AI-EC-EI-3-SEM-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E1493-JAN-2013
BTECH-EC-3-SEM-ELECTRONIC-MATERIALS-AND-PROCESSES-3E1495-JAN-2013
BTECH-EC-3-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-3E1494-JAN-2013
BTECH-EC-AI-EI-BM-3-SEM-ELECTRONIC-DEVICES-AND-CIRCUITS-3E1492-JAN-2013
BTECH-EC-AI-EI-BM-3-SEM-ELECTRONICS-DEVICES-AND-CIRCUITS-3E1492-JAN-2013
BTECH-EC-EI-BM-3-SEM-DATA-STRUCTURES-AND-ALGORITHMS-3E1496-JAN-2013
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1483-JAN-2013
BTECH-EE-3-SEM-COMPUTER-PROGRAMMING-1-3E1482-JAN-2013
BTECH-EE-3-SEM-ELECTRICAL-MACHINES-1-3E1484-JAN-2013
BTECH-EE-3-SEM-ELECTRICAL-MEASUREMENTS-3E1485-JAN-2013
BTECH-EE-3-SEM-POWER-ELECTRONICS-1-3E1481-JAN-2013
BTECH-EE-3-SEM-POWER-ELECTRONICS-1-3E1481-JUN-2013
BTECH-EC-3-SEM-ELECTRONIC-MATERIALS-AND-PROCESSES-3E1495-DEC-2012
BTECH-EC-3-SEM-ELECTRONIC-MATERIALS-AND-PROCESSES-3E1495-JAN-2012
BTECH-EC-3-SEM-STRENGTH-OF-MATERIALS-AND-MECHANICS-OF-STRUCTURES-1-3E2011-JAN-2012
BTECH-EC-AI-EI-3-SEM-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E1493-JAN-2012
BTECH-EC-AI-EI-BM-3-SEM-ELECTRONICS-DEVICES-AND-CIRCUITS-3E1492-JAN-2012
BTECH-EC-EI-BM-3-SEM-DATA-STRUCTURES-AND-ALGORITHMS-3E1496-JAN-2012
BTECH-EC-MB-BM-3-SEM-ELECTRONICS-MEASUREMENTS-AND-INSTRUMENTATION-3E1494-JAN-2012
BTECH-EE-3-SEM-ELECTRICAL-MEASUREMENTS-3E1485-JAN-2012
BTECH-EC-3-SEM-ELECTRONIC-MATERIALS-AND-PROCESSES-3E1495-FEB-2011
BTECH-EC-AI-EI-3-SEM-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E1493-FEB-2011
BTECH-EC-AI-EI-BM-3-SEM-ELECTRONICS-DEVICES-AND-CIRCUITS-3E1492-FEB-2011
BTECH-EC-BM-3-SEM-ELECTRONIC-MEASUREMENTS-AND-INSTRUMENTATION-3E1494-FEB-2011
BTECH-EC-EI-BM-3-SEM-DATA-STRUCTURES-AND-ALGORITHMS-3E1496-FEB-2011
BTECH-EC-EI-BM-3-SEM-DATA-STRUCTURES-AND-ALGORITHMS-3E1496-FEB-2010
BTECH-EE-3-SEM-CIRCUIT-ANALYSIS-1-3E1483-FEB-2010
BTECH-EE-3-SEM-COMPUTER-PROGRAMMING-1-3E1482-FEB-2010
BTECH-EE-3-SEM-ELECTRICAL-MACHINES-1-3E1484-FEB-2010
BTECH-EE-3-SEM-ELECTRICAL-MEASUREMENTS-3E1485-FEB-2010
BTECH-EE-3-SEM-POWER-ELECTRONICS-1-3E1481-FEB-2010
BTECH-EE-EX-3-SEM-MATHEMATICS-3E1486-FEB-2010
BTECH E-ALL EE EX EI EC 4 SEM PAPERS
BTECH-EC-4-SEM-INSTRUMENTATION-4E1328-2024
BTECH-EC-EI-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E1325-2024
BTECH-EC-EI-4-SEM-ANALOG-CIRCUITS-4E1326-2024
BTECH-EC-EI-4-SEM-ANALOGY-AND-DIGITAL-COMMUNICATION-4E1329-2024
BTECH-EE-EX-4-SEM-BIOLOGY-4E1319-2024
BTECH-EE-EX-4-SEM-DIGITAL-ELECTRONICS-4E1324-2024
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINE-2-4E1321-2024
BTECH-EE-EX-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E1320-2024
BTECH-EE-EX-4-SEM-POWER-ELECTRONICS-4E1322-2024
BTECH-EE-EX-4-SEM-SIGNALS-AND-SYSTEM-4E1323-2024
BTECH-EI-4-SEM-MICROCONTROLLER-4E1327-2024
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E1328-JUL-2023
BTECH-EC-EI-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E1325-JUL-2023
BTECH-EE-EEE-4-SEM-BIOLOGY-410601-AUG-2023
BTECH-EE-EX-4-SEM-BIOLOGY-4E1319-JUL-2023
BTECH-EE-EX-4-SEM-DIGITAL-ELECTRONICS-4E1324-JUL-2023
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINE-2-4E1321-JUL-2023
BTECH-EE-EX-4-SEM-POWER-ELECTRONICS-4E1322-JUL-2023
BTECH-EE-EX-4-SEM-SIGNALS-AND-SYSTEMS-4E1323-JUL-2023
BTECH-EI-EC-4-SEM-ANALOG-CIRCUITS-4E1326-JUL-2023
BTECH-EX-EE-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E1320-JUL-2023
BTECH-EE-4-SEM-ELECTRICAL-CIRCUIT-ANALYSIS-AND-SYNTHESIS-3E040521-DEC-2021
BTECH-EC-4-SEM-ELECTRONICS-MEASUREMENT-AND-INSTRUMENTATION-4E1221-NOV-2020
BTECH-EC-4-SEM-RANDOM-VARIABLE-AND-STOCHASTIC-PROCESSES-4E4131-NOV-2020
BTECH-EC-EI-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E1218-NOV-2020
BTECH-EC-EI-4-SEM-ANALOG-AND-DIGITAL-COMMUNICATION-4E1222-NOV-2020
BTECH-EC-EI-4-SEM-ANALOG-CIRCUITS-4E1219-NOV-2020
BTECH-EC-EI-4-SEM-MICROCONTROLLERS-4E1220-NOV-2020
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-NOV-2020
BTECH-EE-EX-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E4176-NOV-2020
BTECH-EE-EX-4-SEM-BIOLOGY-4E1224-NOV-2020
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINE-2-4E1226-NOV-2020
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINES-2-4E4175-NOV-2020
BTECH-EE-EX-4-SEM-SIGNALS-AND-SYSTEMS-4E1228-NOV-2020
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-NOV-2020
BTECH-EX-EE-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E1225-NOV-2020
BTECH-EX-EE-EI-4-SEM-ELECTRICAL-MEASUREMENTS-4E4122-NOV-2020
BTECH-EC-4-SEM-ELECTRONICS-MEASUREMENT-AND-INSTRUMENTATION-4E1221-MAY-2019
BTECH-EC-4-SEM-OPTIMIZATION-TECHNIQUES-4E4134-MAY-2019
BTECH-EC-EI-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E1218-MAY-2019
BTECH-EC-EI-4-SEM-ANALOG-AND-DIGITAL-COMMUNICATION-4EC407-MAY-2019
BTECH-EC-EI-4-SEM-ANALOG-CIRCUITS-4E1219-MAY-2019
BTECH-EC-EI-4-SEM-MICROCONTROLLERS-4E1220-MAY-2019
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-MAY-2019
BTECH-EE-4-SEM-ELECTRICAL-MACHINE-2-4E4175-MAY-2019
BTECH-EE-4-SEM-GENERATION-OF-ELECTRICAL-POWER-4E4174-MAY-2019
BTECH-EE-EX-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E4176-MAY-2019
BTECH-EE-EX-4-SEM-BIOLOGY-4E1224-MAY-2019
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINE-2-4E1226-MAY-2019
BTECH-EE-EX-4-SEM-ELECTRONIC-MEASREMENT-AND-INSTRUMENTATION-4E1225-MAY-2019
BTECH-EE-EX-4-SEM-POWER-ELECTRONICS-4E1227-MAY-2019
BTECH-EE-EX-4-SEM-SIGNALS-AND-SYSTEMS-4E1228-MAY-2019
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-MAY-2019
BTECH-EI-4-SEM-ELECTRICAL-MEASUREMENT-4E4122-MAY-2019
BTECH-EC-4-SEM-ELECTROMAGNETIC-FIELD-THEORY-4E4133-MAY-2018
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E4132-MAY-2018
BTECH-EC-4-SEM-OPTIMIZATION-TECHNIQUES-4E4134-MAY-2018
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E4131-MAY-2018
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-MAY-2018
BTECH-EE-4-SEM-GENERATION-OF-ELECTRICAL-POWER-4E4174-MAY-2018
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINES-2-4E4175-MAY-2018
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-MAY-2018
BTECH-EC-4-SEM-ELECTROMAGNETIC-FIELD-THEORY-4E4133-MAY-2017
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E4132-MAY-2017
BTECH-EC-4-SEM-MATHEMATICS-4-4E4135-MAY-2017
BTECH-EC-4-SEM-OPTIMIZATION-TECHNIQUES-4E4134-MAY-2017
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E4131-MAY-2017
BTECH-EC-AEI-EI-4-SEM-ELECTIVE-OBJECT-ORIENTED-PROGRAMMING-4E2090-MAY-2017
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-MAY-2017
BTECH-EE-4-SEM-COMPUTER-PROGRAMMING-2-4E2112-MAY-2017
BTECH-EE-4-SEM-DIGITAL-ELECTRONICS-4E2110-MAY-2017
BTECH-EE-4-SEM-ELECTRICAL-MACHINES-2-4E4175-MAY-2017
BTECH-EE-4-SEM-GENERATION-OF-ELECTRICAL-POWER-4E4174-MAY-2017
BTECH-EE-4-SEM-POWER-ELECTRONICS-2-4E2109-MAY-2017
BTECH-EE-EX-4-SEM-ADVANCE-ENGINEERING-MATHEMATICS-2-4E4176-JUN-2017
BTECH-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-MAY-2017
BTECH-EI-4-SEM-ELECTRICAL-MEASUREMENT-4E4122-MAY-2017
BTECH-EI-4-SEM-SENSOR-AND-TRANSDUCERS-4E4123-MAY-2017
BTECH-BM-EX-EI-EC-4-SEM-DIGITAL-ELECTRONICS-4E2149-JUL-2016
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E4131-JUL-2016
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-JUL-2016
BTECH-EE-EX-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E4176-JUL-2016
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINES-2-4E4175-JUL-2016
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-JUL-2016
BTECH-EE-EX-EI-4-SEM-ELECTRICAL-MEASUREMENT-4E4122-JUL-2016
BTECH-EC-4-SEM-ELECTROMAGNETIC-FIELD-THEORY-4E4133-JUL-2015
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E4132-JUL-2015
BTECH-EC-4-SEM-OPTIMIZATION-TECHNIQUES-4E4134-JUL-2015
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E4131-JUL-2015
BTECH-EC-BM-AI-EI-4-SEM-OBJECT-ORIENTED-PROGRAMMING-4E2090-JUL-2015
BTECH-EE-4-SEM-ADVANCE-ENGINEERING-MATHEMATICS-2-4E4176-JUL-2015
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-JUL-2015
BTECH-EE-4-SEM-DIGITAL-ELECTRONICS-4E2110-JUL-2015
BTECH-EE-4-SEM-GENERATION-OF-ELECTRICAL-POWER-4E4174-JUL-2015
BTECH-EE-4-SEM-POWER-ELECTRONICS-2-4E2109-JUL-2015
BTECH-EE-EX-4-SEM-ELECTRICAL-MACHINES-2-4E4175-JUL-2015
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-JUL-2015
BTECH-EE-EX-EI-4-SEM-ELECTRICAL-MEASUREMENT-4E4122-JUL-2015
BTECH-EX-4-SEM-ELECTRICAL-ENGINEERING-MATERIALS-4E4128-JUL-2015
BTECH-BM-AI-EC-EI-4-SEM-OBJECT-ORIENTED-PROGRAMMING-4E2090-JUL-2014
BTECH-EC-4-SEM-ELECTROMAGNETIC-FIELD-THEORY-4E4133-JUL-2014
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-INSTRUMENTATION-4E4132-JUL-2014
BTECH-EC-4-SEM-ELECTRONIC-MEASUREMENT-AND-NSTRUMENTATION-4E4132-JUL-2014
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E4131-JUL-2014
BTECH-EE-4-SEM-CIRCUIT-ANALYSIS-2-4E4172-JUL-2014
BTECH-EE-4-SEM-DIGITAL-ELECTRONICS-4E2110-JUL-2014
BTECH-EE-4-SEM-POWER-ELECTRONICS-2-4E2109-JUL-2014
BTECH-EE-EX-4-SEM-ADVANCE-ENGINEERING-MATHEMATICS-2-4E4176-JUL-2014
BTECH-EE-EX-EC-EI-4-SEM-ANALOG-ELECTRONICS-4E4120-JUL-2014
BTECH-EE-EX-EI-4-SEM-ELECTRICAL-MEASUREMENT-4E4122-JUL-2014
BTECH-EX-EE-4-SEM-ELECTRICAL-MACHINES-2-4E4175-JUL-2014
BTECH-EC-4-SEM-RANDOM-VARIABLES-AND-STOCHASTIC-PROCESSES-4E2989-JUL-2013
BTECH-EC-AEI-EI-4-SEM-ELECTIVE-OBJECT-ORIENTED-PROGRAMMING-4E2090-JUL-2013
BTECH-EC-EI-BM-4-SEM-ELECTROMAGNETIC-FIELD-THEORY-4E2088-JUL-2013
BTECH-EC-PE-4-SEM-ADVANCED-ENGINEERING-MATHEMATICS-2-4E2137-JUL-2013
BTECH-EC-PE-4-SEM-MATHEMATICS-4-4E2137-JUL-2013
BTECH-EE-4-SEM-ADVANCED-MATHEMATICS-4E2114-JUL-2013
BTECH-EE-4-SEM-COMPUTER-PROGRAMMING-2-4E2112-JUL-2013
BTECH-EE-4-SEM-DIGITAL-ELECTRONICS-4E2110-JUL-2013
BTECH-EE-4-SEM-ELECTRICAL-ENGINEERING-MATHEMATICS-2-4E2111-JUL-2013
BTECH-EE-4-SEM-ELECTRICAL-MACHINES-2-4E2111-JUL-2013
BTECH-EE-4-SEM-POWER-ELECTRONICS-2-4E2109-JUL-2013
BTECH-EX-4-SEM-DIGITAL-ELECTRONICS-4E2149-JUL-2013
BTECH-EX-4-SEM-ELECTRICAL-ELECTRONICS-4E2149-JUL-2013
BTECH-IC-EC-4-SEM-ANALOG-ELECTRONICS-4E2086-JUL-2013
BTECH-BM-EX-EC-EI-4-SEM-DIGITAL-ELECTRONICS-4E2149-2012
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BTECH-EC-AI-CRE-4-SEM-ELECTIVE-DATA-BASE-MANAGEMENT-SYSTEM-4E2091-2012
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